The MicroMet Plus vertical oscillating analog probe is a measuring instrument designed for ultra-high precision metrology applications, where detecting minimal dimensional variations is essential. The vertical configuration with optimized kinematics ensures stable and direct contact with the measuring point, making it highly effective on complex surfaces and precision components.

With a 0.002 mm resolution and 3 µm accuracy, this probe is ideal for detecting form errors, runout, flatness and parallelism, allowing identification of even the smallest geometric deviations. The reduced 0.2 mm measuring range, combined with the fine 0-10-0 scale, provides exceptional sensitivity, making it particularly suitable for finishing operations, calibration and tight tolerance control.

The internal system is based on high-precision gears mounted on jeweled bearings, reducing friction and enhancing measurement sensitivity and repeatability, ensuring smooth response even in critical applications. The chrome-plated bronze body provides structural strength and stability, maintaining consistent performance in demanding industrial environments.

The rotating bezel for quick zero setting allows fast adjustments during measurement operations, improving efficiency in repetitive inspections. The low measuring force of 0.25 N ensures gentle contact with the workpiece, preventing deformation and guaranteeing reliable results even on delicate components.

This vertical oscillating probe is particularly suitable for height measurement, minimal backlash inspection, spindle runout control and flatness verification, making it essential for advanced quality control, precision workshops, automotive and machine tool manufacturing. It is the ideal solution for technicians and engineers requiring reliable tools for high-level metrology compliant with DIN 2270.