The MicroMet Plus vertical oscillating analog probe is a high-precision measuring instrument designed for detecting extremely small dimensional variations in industrial and metrology applications. Its vertical configuration and optimized kinematics allow highly sensitive measurements even on complex or hard-to-reach surfaces, ensuring stability and repeatability.

With a resolution of 0.002 mm and an accuracy of 3 µm, this probe is ideal for detecting minimal form and geometric errors, making it suitable for runout, flatness and parallelism inspection. The reduced measuring range of 0.2 mm combined with the fine 0-10-0 scale enables extremely detailed readings, perfect for calibration, finishing processes and tight tolerance verification.

The internal mechanism features high-precision gears mounted on jeweled bearings, ensuring smooth, low-friction movement and enhanced sensitivity over time. The chrome-plated bronze body provides structural rigidity and durability, maintaining consistent performance even in demanding industrial environments.

The rotating bezel allows fast and precise zero setting, simplifying adjustment during measurement cycles. The low measuring force of 0.25 N ensures gentle contact with the workpiece, preventing deformation and guaranteeing reliable results, which is critical in high-precision applications.

This vertical oscillating probe is particularly suited for advanced quality control, backlash verification, height measurement and analysis of geometric deviations in precision components. It is an essential tool for technicians, engineers and specialists working in industries where measurement accuracy is critical.